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Udo Mahlstedt

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1995
7EEUdo Mahlstedt, Jürgen Alt, Ingo Hollenbeck: Deterministic test generation for non-classical faults on the gate level. Asian Test Symposium 1995: 244-251
6EEUdo Mahlstedt, Jürgen Alt, Matthias Heinitz: CURRENT: a test generation system for I/sub DDQ/ testing. VTS 1995: 317-323
1993
5 Udo Mahlstedt, Jürgen Alt: Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. ITC 1993: 883-892
4 Udo Mahlstedt: DELTEST: Deterministic Test Generation for Gate-Delay Faults. ITC 1993: 972-980
1991
3 Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991: 194-197
1990
2EETorsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan: Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421
1 Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn: Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD 1990: 222-225

Coauthor Index

1Jürgen Alt [5] [6] [7]
2Wilfried Daehn [1] [2]
3Torsten Grüning [1] [2] [3]
4Matthias Heinitz [6]
5Ingo Hollenbeck [7]
6Hartmut Koopmeiners [3]
7Cengiz Özcan [1] [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)