| 1995 |
|---|
| 7 | EE | Udo Mahlstedt,
Jürgen Alt,
Ingo Hollenbeck:
Deterministic test generation for non-classical faults on the gate level.
Asian Test Symposium 1995: 244-251 |
| 6 | EE | Udo Mahlstedt,
Jürgen Alt,
Matthias Heinitz:
CURRENT: a test generation system for I/sub DDQ/ testing.
VTS 1995: 317-323 |
| 1993 |
|---|
| 5 | | Udo Mahlstedt,
Jürgen Alt:
Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -.
ITC 1993: 883-892 |
| 4 | | Udo Mahlstedt:
DELTEST: Deterministic Test Generation for Gate-Delay Faults.
ITC 1993: 972-980 |
| 1991 |
|---|
| 3 | | Torsten Grüning,
Udo Mahlstedt,
Hartmut Koopmeiners:
DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits.
ICCAD 1991: 194-197 |
| 1990 |
|---|
| 2 | EE | Torsten Grüning,
Udo Mahlstedt,
Wilfried Daehn,
Cengiz Özcan:
Accelerated test pattern generation by cone-oriented circuit partitioning.
EURO-DAC 1990: 418-421 |
| 1 | | Udo Mahlstedt,
Torsten Grüning,
Cengiz Özcan,
Wilfried Daehn:
Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits.
ICCAD 1990: 222-225 |
