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1995 | ||
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4 | EE | Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck: Deterministic test generation for non-classical faults on the gate level. Asian Test Symposium 1995: 244-251 |
3 | EE | Udo Mahlstedt, Jürgen Alt, Matthias Heinitz: CURRENT: a test generation system for I/sub DDQ/ testing. VTS 1995: 317-323 |
1993 | ||
2 | Udo Mahlstedt, Jürgen Alt: Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. ITC 1993: 883-892 | |
1990 | ||
1 | Manfred Geilert, Jürgen Alt, Michael Zimmermann: On the Efficiency of the Transition Fault Model for Delay Faults. ICCAD 1990: 272-275 |
1 | Manfred Geilert | [1] |
2 | Matthias Heinitz | [3] |
3 | Ingo Hollenbeck | [4] |
4 | Udo Mahlstedt | [2] [3] [4] |
5 | Michael Zimmermann | [1] |