Ingo Hollenbeck
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1995
1
EE
Udo Mahlstedt
,
Jürgen Alt
, Ingo Hollenbeck: Deterministic test generation for non-classical faults on the gate level.
Asian Test Symposium 1995
: 244-251
Coauthor
Index
1
Jürgen Alt
[
1
]
2
Udo Mahlstedt
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
