| |
| 1991 | ||
|---|---|---|
| 3 | Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991: 194-197 | |
| 1990 | ||
| 2 | EE | Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan: Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421 |
| 1 | Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn: Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD 1990: 222-225 | |
| 1 | Wilfried Daehn | [1] [2] |
| 2 | Hartmut Koopmeiners | [3] |
| 3 | Udo Mahlstedt | [1] [2] [3] |
| 4 | Cengiz Özcan | [1] [2] |