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Torsten Grüning

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1991
3 Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991: 194-197
1990
2EETorsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan: Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421
1 Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn: Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD 1990: 222-225

Coauthor Index

1Wilfried Daehn [1] [2]
2Hartmut Koopmeiners [3]
3Udo Mahlstedt [1] [2] [3]
4Cengiz Özcan [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)