| 1989 |
|---|
| 8 | | John A. Waicukauski,
Eric Lindbloom,
Edward B. Eichelberger,
Orazio P. Forlenza:
A Method for Generating Weighted Random Test Patterns.
IBM Journal of Research and Development 33(2): 149-161 (1989) |
| 1988 |
|---|
| 7 | | John A. Waicukauski,
Eric Lindbloom:
Fault Detection Effectiveness of Weighted Random Patterns.
ITC 1988: 245-255 |
| 1986 |
|---|
| 6 | | John A. Waicukauski,
Eric Lindbloom,
Vijay S. Iyengar,
Barry K. Rosen:
Transition Fault Simulation by Parallel Pattern Single Fault Propagation.
ITC 1986: 542-551 |
| 1985 |
|---|
| 5 | | John A. Waicukauski,
Eric Lindbloom,
Edward B. Eichelberger,
Donato O. Forlenza,
Tim McCarthy:
A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation.
ITC 1985: 779-784 |
| 1983 |
|---|
| 4 | | Franco Motika,
John A. Waicukauski,
Edward B. Eichelberger,
Eric Lindbloom:
An LSSD Pseudo Random Pattern Test System.
ITC 1983: 283-288 |
| 3 | | Edward B. Eichelberger,
Eric Lindbloom:
Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test.
IBM Journal of Research and Development 27(3): 265-272 (1983) |
| 1980 |
|---|
| 2 | | Edward B. Eichelberger,
Eric Lindbloom:
A Heuristic Test-Pattern Generator for Programmable Logic Arrays.
IBM Journal of Research and Development 24(1): 15-22 (1980) |
| 1975 |
|---|
| 1 | | H. Daniel Schnurmann,
Eric Lindbloom,
Robert G. Carpenter:
The Weighted Random Test-Pattern Generator.
IEEE Trans. Computers 24(7): 695-700 (1975) |
