| 1991 |
|---|
| 9 | | Edward B. Eichelberger,
Stephen E. Bello:
Differential current switch-High performance at low power.
IBM Journal of Research and Development 35(3): 313-320 (1991) |
| 1989 |
|---|
| 8 | | John A. Waicukauski,
Eric Lindbloom,
Edward B. Eichelberger,
Orazio P. Forlenza:
A Method for Generating Weighted Random Test Patterns.
IBM Journal of Research and Development 33(2): 149-161 (1989) |
| 1985 |
|---|
| 7 | | Edward B. Eichelberger:
Experiences and Expectations in VLSI Testing.
ITC 1985: 4 |
| 6 | | John A. Waicukauski,
Eric Lindbloom,
Edward B. Eichelberger,
Donato O. Forlenza,
Tim McCarthy:
A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation.
ITC 1985: 779-784 |
| 1983 |
|---|
| 5 | | Franco Motika,
John A. Waicukauski,
Edward B. Eichelberger,
Eric Lindbloom:
An LSSD Pseudo Random Pattern Test System.
ITC 1983: 283-288 |
| 4 | | Edward B. Eichelberger,
Eric Lindbloom:
Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test.
IBM Journal of Research and Development 27(3): 265-272 (1983) |
| 1980 |
|---|
| 3 | | Edward B. Eichelberger,
Eric Lindbloom:
A Heuristic Test-Pattern Generator for Programmable Logic Arrays.
IBM Journal of Research and Development 24(1): 15-22 (1980) |
| 1964 |
|---|
| 2 | | Edward B. Eichelberger:
Hazard detection in combinational and sequential switching circuits
FOCS 1964: 111-120 |
| 1963 |
|---|
| 1 | | Edward B. Eichelberger:
Sequential circuit synthesis using input delays
FOCS 1963: 105-116 |
