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IBM Journal of Research and Development, Volume 33, 1989

selected papers

Volume 33, Number 1, January 1989

Volume 33, Number 2, March 1989

Geometric Modeling Vector Processing Weighted Random-Pattern Testing Integrated-Circuit Chip Yield

Volume 33, Number 4, July 1989

Volume 33, Number 5, September 1989

Volume 33, Number 6, November 1989

Copyright © Sun May 17 00:00:09 2009 by Michael Ley (ley@uni-trier.de)