G. P. Beyer
List of publications from the
DBLP Bibliography Server
-
FAQ
Coauthor Index
- Ask others: ACM
DL
/
Guide
-
CiteSeer
-
CSB
-
Google
-
MSN
-
Yahoo
2005
1
EE
Zs. Tökei
,
Y.-L. Li
, G. P. Beyer: Reliability challenges for copper low-k dielectrics and copper diffusion barriers.
Microelectronics Reliability 45
(9-11): 1436-1442 (2005)
Coauthor
Index
1
Y.-L. Li
[
1
]
2
Zs. Tökei
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)