| |
| 2005 | ||
|---|---|---|
| 1 | EE | Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal Mielke, Ramez Nachman: The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectronics Reliability 45(1): 107-114 (2005) |
| 1 | Yung-Huei Lee | [1] |
| 2 | Neal Mielke | [1] |
| 3 | Ramez Nachman | [1] |
| 4 | Stefan Stadler | [1] |