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| 2005 | ||
|---|---|---|
| 1 | EE | Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal Mielke, Ramez Nachman: The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectronics Reliability 45(1): 107-114 (2005) |
| 1 | Steve Jacobs | [1] |
| 2 | Yung-Huei Lee | [1] |
| 3 | Neal Mielke | [1] |
| 4 | Ramez Nachman | [1] |