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Stefan Stadler

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2005
1EEYung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal Mielke, Ramez Nachman: The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectronics Reliability 45(1): 107-114 (2005)

Coauthor Index

1Steve Jacobs [1]
2Yung-Huei Lee [1]
3Neal Mielke [1]
4Ramez Nachman [1]

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