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C. K. Yoon

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2005
2EEJ. Y. Seo, K. J. Lee, Y. S. Kim, S. Y. Lee, S. J. Hwang, C. K. Yoon: Reliability for Recessed Channel Structure n-MOSFET. Microelectronics Reliability 45(9-11): 1317-1320 (2005)
1EEJ. Y. Seo, K. J. Lee, S. Y. Lee, S. J. Hwang, C. K. Yoon: Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics. Microelectronics Reliability 45(9-11): 1360-1364 (2005)

Coauthor Index

1S. J. Hwang [1] [2]
2Y. S. Kim [2]
3K. J. Lee [1] [2]
4S. Y. Lee [1] [2]
5J. Y. Seo [1] [2]

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