| |
| 2005 | ||
|---|---|---|
| 2 | EE | J. Y. Seo, K. J. Lee, Y. S. Kim, S. Y. Lee, S. J. Hwang, C. K. Yoon: Reliability for Recessed Channel Structure n-MOSFET. Microelectronics Reliability 45(9-11): 1317-1320 (2005) |
| 1 | EE | J. Y. Seo, K. J. Lee, S. Y. Lee, S. J. Hwang, C. K. Yoon: Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics. Microelectronics Reliability 45(9-11): 1360-1364 (2005) |
| 1 | S. J. Hwang | [1] [2] |
| 2 | Y. S. Kim | [2] |
| 3 | K. J. Lee | [1] [2] |
| 4 | S. Y. Lee | [1] [2] |
| 5 | C. K. Yoon | [1] [2] |