| 2007 |
|---|
| 7 | EE | Rui Xiao,
Amit Laknaur,
Haibo Wang:
A Fully Programmable Analog Window Comparator.
ISCAS 2007: 3872-3875 |
| 6 | EE | Amit Laknaur,
Rui Xiao,
Sai Raghuram Durbha,
Haibo Wang:
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications.
ISQED 2007: 501-506 |
| 5 | EE | Amit Laknaur,
Rui Xiao,
Haibo Wang:
A Programmable Window Comparator for Analog Online Testing.
VTS 2007: 119-124 |
| 2006 |
|---|
| 4 | EE | Amit Laknaur,
Haibo Wang:
Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits.
ISQED 2006: 531-536 |
| 3 | EE | Sai Raghuram Durbha,
Amit Laknaur,
Haibo Wang:
Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques.
VTS 2006: 320-325 |
| 2 | EE | Amit Laknaur,
Sai Raghuram Durbha,
Haibo Wang:
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays.
J. Electronic Testing 22(4-6): 449-462 (2006) |
| 2005 |
|---|
| 1 | EE | Amit Laknaur,
Haibo Wang:
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays.
ISQED 2005: 434-439 |
