| |
| 2007 | ||
|---|---|---|
| 3 | EE | Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang: Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. ISQED 2007: 501-506 |
| 2006 | ||
| 2 | EE | Sai Raghuram Durbha, Amit Laknaur, Haibo Wang: Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. VTS 2006: 320-325 |
| 1 | EE | Amit Laknaur, Sai Raghuram Durbha, Haibo Wang: Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. J. Electronic Testing 22(4-6): 449-462 (2006) |
| 1 | Amit Laknaur | [1] [2] [3] |
| 2 | Haibo Wang | [1] [2] [3] |
| 3 | Rui Xiao | [3] |