| 2006 |
|---|
| 3 | EE | Chang-ai Sun,
Yunwei Dong,
R. Lai,
K. Y. Sim,
Tsong Yueh Chen:
Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions.
CIT 2006: 184 |
| 2 | EE | Y. C. Chou,
D. Leung,
R. Grundbacher,
R. Lai,
Q. Kan,
P. H. Liu,
D. Eng,
T. Block,
A. Oki:
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs.
Microelectronics Reliability 46(1): 24-40 (2006) |
| 2004 |
|---|
| 1 | EE | Y. C. Chou,
D. Leung,
I. Smorchkova,
M. Wojtowicz,
R. Grundbacher,
L. Callejo,
Q. Kan,
R. Lai,
P. H. Liu,
D. Eng:
Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting.
Microelectronics Reliability 44(7): 1033-1038 (2004) |
