| |
| 2004 | ||
|---|---|---|
| 1 | EE | Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng: Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability 44(7): 1033-1038 (2004) |
| 1 | L. Callejo | [1] |
| 2 | Y. C. Chou | [1] |
| 3 | D. Eng | [1] |
| 4 | R. Grundbacher | [1] |
| 5 | Q. Kan | [1] |
| 6 | R. Lai | [1] |
| 7 | D. Leung | [1] |
| 8 | P. H. Liu | [1] |
| 9 | I. Smorchkova | [1] |