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D. Eng

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2006
2EEY. C. Chou, D. Leung, R. Grundbacher, R. Lai, Q. Kan, P. H. Liu, D. Eng, T. Block, A. Oki: Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectronics Reliability 46(1): 24-40 (2006)
2004
1EEY. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng: Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability 44(7): 1033-1038 (2004)

Coauthor Index

1T. Block [2]
2L. Callejo [1]
3Y. C. Chou [1] [2]
4R. Grundbacher [1] [2]
5Q. Kan [1] [2]
6R. Lai [1] [2]
7D. Leung [1] [2]
8P. H. Liu [1] [2]
9A. Oki [2]
10I. Smorchkova [1]
11M. Wojtowicz [1]

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