Y. C. Chou

2006
2	EE	Y. C. Chou, D. Leung, R. Grundbacher, R. Lai, Q. Kan, P. H. Liu, D. Eng, T. Block, A. Oki: Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectronics Reliability 46(1): 24-40 (2006)
2004
1	EE	Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng: Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability 44(7): 1033-1038 (2004)

Coauthor Index

1	T. Block	[2]
2	L. Callejo	[1]
3	D. Eng	[1] [2]
4	R. Grundbacher	[1] [2]
5	Q. Kan	[1] [2]
6	R. Lai	[1] [2]
7	D. Leung	[1] [2]
8	P. H. Liu	[1] [2]
9	A. Oki	[2]
10	I. Smorchkova	[1]
11	M. Wojtowicz	[1]