2003 |
3 | EE | Dongwoo Lee,
Wesley Kwong,
David Blaauw,
Dennis Sylvester:
Analysis and minimization techniques for total leakage considering gate oxide leakage.
DAC 2003: 175-180 |
2 | EE | Dongwoo Lee,
Wesley Kwong,
David Blaauw,
Dennis Sylvester:
Simultaneous Subthreshold and Gate-Oxide Tunneling Leakage Current Analysis in Nanometer CMOS Design.
ISQED 2003: 287-292 |
1 | EE | Robert Bai,
Sarvesh H. Kulkarni,
Wesley Kwong,
Ashish Srivastava,
Dennis Sylvester,
David Blaauw:
An Implementation of a 32-bit ARM Processor Using Dual Power Supplies and Dual Threshold Voltages.
ISVLSI 2003: 149-154 |