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Wesley Kwong

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2003
3EEDongwoo Lee, Wesley Kwong, David Blaauw, Dennis Sylvester: Analysis and minimization techniques for total leakage considering gate oxide leakage. DAC 2003: 175-180
2EEDongwoo Lee, Wesley Kwong, David Blaauw, Dennis Sylvester: Simultaneous Subthreshold and Gate-Oxide Tunneling Leakage Current Analysis in Nanometer CMOS Design. ISQED 2003: 287-292
1EERobert Bai, Sarvesh H. Kulkarni, Wesley Kwong, Ashish Srivastava, Dennis Sylvester, David Blaauw: An Implementation of a 32-bit ARM Processor Using Dual Power Supplies and Dual Threshold Voltages. ISVLSI 2003: 149-154

Coauthor Index

1Robert Bai [1]
2David Blaauw (David T. Blaauw) [1] [2] [3]
3Sarvesh H. Kulkarni [1]
4Dongwoo Lee [2] [3]
5Ashish Srivastava [1]
6Dennis Sylvester [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)