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Smita Krishnaswamy

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2009
6EESmita Krishnaswamy, Stephen Plaza, Igor L. Markov, John P. Hayes: Signature-Based SER Analysis and Design of Logic Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 28(1): 74-86 (2009)
2008
5EESmita Krishnaswamy, Igor L. Markov, John P. Hayes: On the role of timing masking in reliable logic circuit design. DAC 2008: 924-929
4EESmita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes: Probabilistic transfer matrices in symbolic reliability analysis of logic circuits. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)
2007
3EESmita Krishnaswamy, Stephen Plaza, Igor L. Markov, John P. Hayes: Enhancing design robustness with reliability-aware resynthesis and logic simulation. ICCAD 2007: 149-154
2EESmita Krishnaswamy, Igor L. Markov, John P. Hayes: Tracking Uncertainty with Probabilistic Logic Circuit Testing. IEEE Design & Test of Computers 24(4): 312-321 (2007)
2005
1EESmita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes: Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices. DATE 2005: 282-287

Coauthor Index

1John P. Hayes [1] [2] [3] [4] [5] [6]
2Igor L. Markov [1] [2] [3] [4] [5] [6]
3Stephen Plaza [3] [6]
4George F. Viamontes [1] [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)