Uwe Kerst

List of publications from the DBLP Bibliography Server - FAQ

2006

2 EE Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit: Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. Microelectronics Reliability 46(9-11): 1498-1503 (2006)

2005

1 EE Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005)

2006
2	EE	Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit: Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. Microelectronics Reliability 46(9-11): 1498-1503 (2006)
2005
1	EE	Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005)

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