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A. Kabakow

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2005
1EERudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005)

Coauthor Index

1Christian Boit [1]
2Uwe Kerst [1]
3Rudolf Schlangen [1]

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