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2005 | ||
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1 | EE | Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005) |
1 | Christian Boit | [1] |
2 | Uwe Kerst | [1] |
3 | Rudolf Schlangen | [1] |