|  |  | 
| 2005 | ||
|---|---|---|
| 1 | EE | Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005) | 
| 1 | Christian Boit | [1] | 
| 2 | Uwe Kerst | [1] | 
| 3 | Rudolf Schlangen | [1] |