| |
| 2008 | ||
|---|---|---|
| 3 | EE | Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly, Andrzej Pfitzner, Dominik Kasprowicz: Is there always performance overhead for regular fabric? ICCD 2008: 557-562 |
| 2003 | ||
| 2 | EE | Dominik Kasprowicz, Witold A. Pleskacz: Improvement of integrated circuit testing reliability by using the defect based approach. Microelectronics Reliability 43(6): 945-953 (2003) |
| 2001 | ||
| 1 | EE | Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz: CMOS Standard Cells Characterization for Defect Based Testing. DFT 2001: 384- |
| 1 | Wieslaw Kuzmicz | [1] |
| 2 | Yi-Wei Lin | [3] |
| 3 | Wojciech Maly | [3] |
| 4 | Malgorzata Marek-Sadowska | [3] |
| 5 | Tomasz Oleszczak | [1] |
| 6 | Andrzej Pfitzner | [3] |
| 7 | Witold A. Pleskacz | [1] [2] |