M. Goroll
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2006
1
EE
M. Goroll,
W. Kanert
,
R. Pufall
: ESD protection structure qualification - a new approach for release for automotive applications.
Microelectronics Reliability 46
(9-11): 1648-1651 (2006)
Coauthor
Index
1
W. Kanert
[
1
]
2
R. Pufall
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
