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R. Pufall

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2006
1EEM. Goroll, W. Kanert, R. Pufall: ESD protection structure qualification - a new approach for release for automotive applications. Microelectronics Reliability 46(9-11): 1648-1651 (2006)

Coauthor Index

1M. Goroll [1]
2W. Kanert [1]

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