Y. Ji

2006
2	EE	J. F. Luo, Y. Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen: EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectronics Reliability 46(1): 178-182 (2006)
2002
1	EE	T. H. Lee, X. Guo, G. D. Shen, Y. Ji, G. H. Wang, J. Y. Du, X. Z. Wang, G. Gao, A. Altes, L. J. Balk: Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM). Microelectronics Reliability 42(9-11): 1711-1714 (2002)

Coauthor Index

1	A. Altes	[1]
2	L. J. Balk	[1]
3	J. Y. Du	[1]
4	G. Gao	[1]
5	X. Guo	[1] [2]
6	J. Han	[2]
7	T. H. Lee	[1]
8	J. P. Liu	[2]
9	J. F. Luo	[2]
10	N. H. Niu	[2]
11	G. D. Shen	[1] [2]
12	G. H. Wang	[1]
13	J. Z. Wang	[2]
14	X. Z. Wang	[1]
15	Y. Q. Zhang	[2]
16	T. X. Zhong	[2]