Y. Ji

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2EEJ. F. Luo, Y. Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen: EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectronics Reliability 46(1): 178-182 (2006)
1EET. H. Lee, X. Guo, G. D. Shen, Y. Ji, G. H. Wang, J. Y. Du, X. Z. Wang, G. Gao, A. Altes, L. J. Balk: Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM). Microelectronics Reliability 42(9-11): 1711-1714 (2002)

Coauthor Index

1A. Altes [1]
2L. J. Balk [1]
3J. Y. Du [1]
4G. Gao [1]
5X. Guo [1] [2]
6J. Han [2]
7T. H. Lee [1]
8J. P. Liu [2]
9J. F. Luo [2]
10N. H. Niu [2]
11G. D. Shen [1] [2]
12G. H. Wang [1]
13J. Z. Wang [2]
14X. Z. Wang [1]
15Y. Q. Zhang [2]
16T. X. Zhong [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)