L. J. Balk

2006
2	EE	L. J. Balk, W. H. Gerling, E. Wolfgang: Editorial. Microelectronics Reliability 46(9-11): 1401-1402 (2006)
2002
1	EE	T. H. Lee, X. Guo, G. D. Shen, Y. Ji, G. H. Wang, J. Y. Du, X. Z. Wang, G. Gao, A. Altes, L. J. Balk: Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM). Microelectronics Reliability 42(9-11): 1711-1714 (2002)

Coauthor Index

1	A. Altes	[1]
2	J. Y. Du	[1]
3	G. Gao	[1]
4	W. H. Gerling	[2]
5	X. Guo	[1]
6	Y. Ji	[1]
7	T. H. Lee	[1]
8	G. D. Shen	[1]
9	G. H. Wang	[1]
10	X. Z. Wang	[1]
11	E. Wolfgang	[2]

Colors in the list of coauthors