Y. Q. Zhang

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1EEJ. F. Luo, Y. Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen: EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectronics Reliability 46(1): 178-182 (2006)

Coauthor Index

1X. Guo [1]
2J. Han [1]
3Y. Ji [1]
4J. P. Liu [1]
5J. F. Luo [1]
6N. H. Niu [1]
7G. D. Shen [1]
8J. Z. Wang [1]
9T. X. Zhong [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)