J. F. Luo

2006
1	EE	J. F. Luo, Y. Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen: EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectronics Reliability 46(1): 178-182 (2006)

Coauthor Index

1	X. Guo	[1]
2	J. Han	[1]
3	Y. Ji	[1]
4	J. P. Liu	[1]
5	N. H. Niu	[1]
6	G. D. Shen	[1]
7	J. Z. Wang	[1]
8	Y. Q. Zhang	[1]
9	T. X. Zhong	[1]