| 2007 |
|---|
| 6 | EE | Milan Jevtic,
Jovan M. Hadzi-Vukovic:
Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements.
Microelectronics Reliability 47(1): 51-58 (2007) |
| 2004 |
|---|
| 5 | EE | Milan Jevtic:
Low frequency noise as a tool to study optocouplers with phototransistors.
Microelectronics Reliability 44(7): 1123-1129 (2004) |
| 2003 |
|---|
| 4 | EE | I. Stanimirovic,
Milan Jevtic,
Z. Stanimirovic:
High-voltage pulse stressing of thick-film resistors and noise.
Microelectronics Reliability 43(6): 905-911 (2003) |
| 2001 |
|---|
| 3 | EE | Milan Jevtic:
Guidebook for Managing Silicon Chip Reliability; Michael G. Pecht, Riko Radojcic, Gopal Rao. CRC Press LLC, Boca Raton, 1999, 224 pp. ISBN: 0-8493-9624-7.
Microelectronics Reliability 41(1): 141-142 (2001) |
| 2 | EE | Milan Jevtic,
Z. Stanimirovic,
I. Stanimirovic:
Evaluation of thick-film resistor structural parameters based on noise index measurements.
Microelectronics Reliability 41(1): 59-66 (2001) |
| 1 | EE | Milan Jevtic:
Optimal Reliability Design: Fundamentals and Applications; Way Kuo, Rajendra Prasad, Frank A. Tillman, Ching-Lai Mwang. Cambridge University Press, Cambridge, 2001, 389+XXI pp. ISBN: 0-521-78127-2 (hardbound).
Microelectronics Reliability 41(4): 623-624 (2001) |
