Jovan M. Hadzi-Vukovic

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2007

1 EE Milan Jevtic, Jovan M. Hadzi-Vukovic: Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements. Microelectronics Reliability 47(1): 51-58 (2007)

2007
1	EE	Milan Jevtic, Jovan M. Hadzi-Vukovic: Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements. Microelectronics Reliability 47(1): 51-58 (2007)

Coauthor Index

1 Milan Jevtic [1]