| |
| 2003 | ||
|---|---|---|
| 2 | EE | I. Stanimirovic, Milan Jevtic, Z. Stanimirovic: High-voltage pulse stressing of thick-film resistors and noise. Microelectronics Reliability 43(6): 905-911 (2003) |
| 2001 | ||
| 1 | EE | Milan Jevtic, Z. Stanimirovic, I. Stanimirovic: Evaluation of thick-film resistor structural parameters based on noise index measurements. Microelectronics Reliability 41(1): 59-66 (2001) |
| 1 | Milan Jevtic | [1] [2] |
| 2 | Z. Stanimirovic | [1] [2] |