K. Fujishima

1986
1		Y. Nishimura, M. Hamada, H. Hidaka, H. Ozaki, K. Fujishima, Y. Hayasaka: Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode. ITC 1986: 826-829

Coauthor Index

1	M. Hamada	[1]
2	Y. Hayasaka	[1]
3	H. Hidaka	[1]
4	Y. Nishimura	[1]
5	H. Ozaki	[1]