| 2004 |
|---|
| 12 | EE | Tom Chen,
Amjad Hajjar:
Statistical timing analysis of coupled interconnects using quadratic delay-change characteristics.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(12): 1677-1683 (2004) |
| 2003 |
|---|
| 11 | EE | Tom Chen,
Amjad Hajjar:
Analyzing Statistical Timing Behavior of Coupled Interconnects Using Quadratic Delay Change Characteristics.
ISQED 2003: 183-188 |
| 2002 |
|---|
| 10 | EE | Amjad Hajjar,
Tom Chen:
An Accurate Coverage Forecasting Model for Behavioral Model Verification.
DELTA 2002: 104-110 |
| 9 | EE | Amjad Hajjar,
Tom Chen:
Improving the Efficiency and Quality of Simulation-Based Behavioral Model Verification Using Dynamic Bayesian Criteria.
ISQED 2002: 304-309 |
| 8 | EE | Tom Chen,
Andre Bai,
Amjad Hajjar,
Anneliese Amschler Andrews,
Charles Anderson:
Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification.
J. Electronic Testing 18(6): 583-594 (2002) |
| 2001 |
|---|
| 7 | EE | Amjad Hajjar,
Tom Chen,
Isabelle Munn,
Anneliese Amschler Andrews,
Maria Bjorkman:
High quality behavioral verification using statistical stopping criteria.
DATE 2001: 411-419 |
| 6 | EE | Amjad Hajjar,
Tom Chen,
Isabelle Munn,
Anneliese Amschler Andrews,
Maria Bjorkman:
Stopping Criteria Comparison: Towards High Quality Behavioral Verification.
ISQED 2001: 31-37 |
| 2000 |
|---|
| 5 | EE | Tom Chen,
Anneliese von Mayrhauser,
Amjad Hajjar,
Charles Anderson,
Mehmet Sahinoglu:
Achieving the Quality of Verification for Behavioral Models with Minimum Effort.
ISQED 2000: 234- |
| 1999 |
|---|
| 4 | EE | Tom Chen,
Anneliese von Mayrhauser,
Amjad Hajjar,
Charles Anderson,
Mehmet Sahinoglu:
How Much Testing is Enough? Applying Stopping Rules to Behavioral Model Testing.
HASE 1999: 249-256 |
| 3 | | Tom Chen,
Isabelle Munn,
Anneliese von Mayrhauser,
Amjad Hajjar:
Efficient Verification of Behavioral Models Using Sequential Sampling Technique.
VLSI 1999: 398-406 |
| 2 | EE | Amjad Hajjar,
Tom Chen:
VLSI Architecture for Real-Time Edge Linking.
IEEE Trans. Pattern Anal. Mach. Intell. 21(1): 89-94 (1999) |
| 1998 |
|---|
| 1 | EE | Anneliese von Mayrhauser,
Andre Bai,
Tom Chen,
Charles Anderson,
Amjad Hajjar:
Fast Antirandom (FAR) Test Generation.
HASE 1998: 262-269 |
