| 2005 |
|---|
| 7 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Synchronization overhead in SOC compressed test.
IEEE Trans. VLSI Syst. 13(1): 140-152 (2005) |
| 2003 |
|---|
| 6 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Test Data Compression: The System Integrator's Perspective.
DATE 2003: 10726-10731 |
| 5 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Addressing useless test data in core-based system-on-a-chip test.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(11): 1568-1580 (2003) |
| 4 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Variable-length input Huffman coding for system-on-a-chip test.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(6): 783-796 (2003) |
| 2002 |
|---|
| 3 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression.
DATE 2002: 604-611 |
| 2 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing.
ITC 2002: 64-73 |
| 1 | EE | Paul Theo Gonciari,
Bashir M. Al-Hashimi,
Nicola Nicolici:
Useless Memory Allocation in System-on-a-Chip Test: Problems and Solutions.
VTS 2002: 423-432 |
