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| 2009 | ||
|---|---|---|
| 8 | EE | Siddharth Garg, Diana Marculescu: 3D-GCP: An analytical model for the impact of process variations on the critical path delay distribution of 3D ICs. ISQED 2009: 147-155 |
| 2008 | ||
| 7 | EE | Siddharth Garg, Diana Marculescu: System-level mitigation of WID leakage power variability using body-bias islands. CODES+ISSS 2008: 273-278 |
| 6 | EE | Siddharth Garg, Diana Marculescu: System-level throughput analysis for process variation aware multiple voltage-frequency island designs. ACM Trans. Design Autom. Electr. Syst. 13(4): (2008) |
| 5 | EE | Diana Marculescu, Siddharth Garg: Process-Driven Variability Analysis of Single and Multiple Voltage-Frequency Island Latency-Constrained Systems. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 893-905 (2008) |
| 2007 | ||
| 4 | EE | Siddharth Garg, Diana Marculescu: On the impact of manufacturing process variations on the lifetime of sensor networks. CODES+ISSS 2007: 203-208 |
| 3 | EE | Siddharth Garg, Diana Marculescu: Interactive presentation: System-level process variation driven throughput analysis for single and multiple voltage-frequency island designs. DATE 2007: 403-408 |
| 2006 | ||
| 2 | EE | Diana Marculescu, Siddharth Garg: System-level process-driven variability analysis for single and multiple voltage-frequency island systems. ICCAD 2006: 541-546 |
| 2004 | ||
| 1 | EE | Siddharth Garg, Siddharth Tata, Ravishankar Arunachalam: Static Transition Probability Analysis Under Uncertainty. ICCD 2004: 380-386 |
| 1 | Ravishankar Arunachalam | [1] |
| 2 | Diana Marculescu | [2] [3] [4] [5] [6] [7] [8] |
| 3 | Siddharth Tata | [1] |