| 2006 |
|---|
| 3 | EE | W. Bergbauer,
T. Lutz,
Werner Frammelsberger,
Guenther Benstetter:
Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures.
Microelectronics Reliability 46(9-11): 1736-1740 (2006) |
| 2005 |
|---|
| 2 | EE | Peter Breitschopf,
Guenther Benstetter,
Bernhard Knoll,
Werner Frammelsberger:
Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling.
Microelectronics Reliability 45(9-11): 1568-1571 (2005) |
| 2003 |
|---|
| 1 | EE | Werner Frammelsberger,
Guenther Benstetter,
Thomas Schweinboeck,
Richard J. Stamp,
Janice Kiely:
Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy.
Microelectronics Reliability 43(9-11): 1465-1470 (2003) |
