| |
| 2006 | ||
|---|---|---|
| 1 | EE | W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter: Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability 46(9-11): 1736-1740 (2006) |
| 1 | Guenther Benstetter | [1] |
| 2 | W. Bergbauer | [1] |
| 3 | Werner Frammelsberger | [1] |