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Bernhard Knoll

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2005
1EEPeter Breitschopf, Guenther Benstetter, Bernhard Knoll, Werner Frammelsberger: Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling. Microelectronics Reliability 45(9-11): 1568-1571 (2005)

Coauthor Index

1Guenther Benstetter [1]
2Peter Breitschopf [1]
3Werner Frammelsberger [1]

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