2007 |
7 | EE | Imad A. Ferzli,
Farid N. Najm,
Lars Kruse:
A geometric approach for early power grid verification using current constraints.
ICCAD 2007: 40-47 |
6 | EE | Imad A. Ferzli,
Farid N. Najm,
Lars Kruse:
Early power grid verification under circuit current uncertainties.
ISLPED 2007: 116-121 |
5 | EE | Farid N. Najm,
Noel Menezes,
Imad A. Ferzli:
A Yield Model for Integrated Circuits and its Application to Statistical Timing Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 574-591 (2007) |
2006 |
4 | EE | Imad A. Ferzli,
Farid N. Najm:
Analysis and verification of power grids considering process-induced leakage-current variations.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 126-143 (2006) |
2005 |
3 | | Dionysios Kouroussis,
Imad A. Ferzli,
Farid N. Najm:
Incremental partitioning-based vectorless power grid verification.
ICCAD 2005: 358-364 |
2003 |
2 | EE | Imad A. Ferzli,
Farid N. Najm:
Statistical estimation of leakage-induced power grid voltage drop considering within-die process variations.
DAC 2003: 856-859 |
1 | EE | Imad A. Ferzli,
Farid N. Najm:
Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations.
ICCAD 2003: 770-777 |