Beyin Chen

List of publications from the DBLP Bibliography Server - FAQ

1995

3 EE Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen, Beyin Chen: Fanout fault analysis for digital logic circuits. Asian Test Symposium 1995: 33-39

2 EE Beyin Chen, Chung-Len Lee: Universal test set generation for CMOS circuits. J. Electronic Testing 6(3): 313-323 (1995)

1994

1 EE Beyin Chen, Chung-Len Lee: A complement-based fast algorithm to generate universal test sets for multi-output functions. IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 370-377 (1994)

1995
3	EE	Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen, Beyin Chen: Fanout fault analysis for digital logic circuits. Asian Test Symposium 1995: 33-39
2	EE	Beyin Chen, Chung-Len Lee: Universal test set generation for CMOS circuits. J. Electronic Testing 6(3): 313-323 (1995)
1994
1	EE	Beyin Chen, Chung-Len Lee: A complement-based fast algorithm to generate universal test sets for multi-output functions. IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 370-377 (1994)

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