| 2003 |
|---|
| 4 | EE | J. C. H. Phang,
D. S. H. Chan,
V. K. S. Ong,
S. Kolachina,
J. M. Chin,
M. Palaniappan,
G. Gilfeather,
Y. X. Seah:
Single contact beam induced current phenomenon for microelectronic failure analysis.
Microelectronics Reliability 43(9-11): 1595-1602 (2003) |
| 2001 |
|---|
| 3 | EE | J. M. Chin,
J. C. H. Phang,
D. S. H. Chan,
M. Palaniappan,
G. Gilfeather,
C. E. Soh:
Single contact optical beam induced currents.
Microelectronics Reliability 41(8): 1237-1242 (2001) |
| 2000 |
|---|
| 2 | EE | H. M. Chen,
G. S. Samudra,
D. S. H. Chan,
Yaacob Ibrahim:
Global optimization for digital MOS circuits performance.
IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 161-164 (2000) |
| 1999 |
|---|
| 1 | EE | G. S. Samudra,
H. M. Chen,
D. S. H. Chan,
Yaacob Ibrahim:
Yield Optimization by Design Centering and Worst-Case Distance Analysis.
ICCD 1999: 289-290 |
