M. Palaniappan

2003
2	EE	J. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah: Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectronics Reliability 43(9-11): 1595-1602 (2003)
2001
1	EE	J. M. Chin, J. C. H. Phang, D. S. H. Chan, M. Palaniappan, G. Gilfeather, C. E. Soh: Single contact optical beam induced currents. Microelectronics Reliability 41(8): 1237-1242 (2001)

Coauthor Index

1	D. S. H. Chan	[1] [2]
2	J. M. Chin	[1] [2]
3	G. Gilfeather	[1] [2]
4	S. Kolachina	[2]
5	V. K. S. Ong	[2]
6	J. C. H. Phang	[1] [2]
7	Y. X. Seah	[2]
8	C. E. Soh	[1]