| 2006 |
|---|
| 3 | EE | O. Briat,
W. Lajnef,
J.-M. Vinassa,
E. Woirgard:
Power cycling tests for accelerated ageing of ultracapacitors.
Microelectronics Reliability 46(9-11): 1445-1450 (2006) |
| 2005 |
|---|
| 2 | EE | W. Lajnef,
J.-M. Vinassa,
O. Briat,
E. Woirgard:
Specification and use of pulsed current profiles for ultracapacitors power cycling.
Microelectronics Reliability 45(9-11): 1746-1749 (2005) |
| 2003 |
|---|
| 1 | EE | S. Azzopardi,
E. Woirgard,
J.-M. Vinassa,
O. Briat,
C. Zardini:
IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?
Microelectronics Reliability 43(9-11): 1901-1906 (2003) |
