| |
| 2006 | ||
|---|---|---|
| 2 | EE | O. Briat, W. Lajnef, J.-M. Vinassa, E. Woirgard: Power cycling tests for accelerated ageing of ultracapacitors. Microelectronics Reliability 46(9-11): 1445-1450 (2006) |
| 2005 | ||
| 1 | EE | W. Lajnef, J.-M. Vinassa, O. Briat, E. Woirgard: Specification and use of pulsed current profiles for ultracapacitors power cycling. Microelectronics Reliability 45(9-11): 1746-1749 (2005) |
| 1 | O. Briat | [1] [2] |
| 2 | J.-M. Vinassa | [1] [2] |
| 3 | E. Woirgard | [1] [2] |