| |
| 2001 | ||
|---|---|---|
| 2 | EE | Mykola Blyzniuk, Irena Kazymyra: Development of the Special Software Tools for the Defect/Fault Analysis in the Complex Gates from Standard Cell Library. DFT 2001: 375-383 |
| 1 | EE | Mykola Blyzniuk, Irena Kazymyra, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar: Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement. Microelectronics Reliability 41(12): 2023-2040 (2001) |
| 1 | Irena Kazymyra | [1] [2] |
| 2 | Wieslaw Kuzmicz | [1] |
| 3 | Witold A. Pleskacz | [1] |
| 4 | Jaan Raik | [1] |
| 5 | Raimund Ubar | [1] |