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| 2002 | ||
|---|---|---|
| 1 | EE | N. Bicaïs-Lépinay, F. André, R. Pantel, S. Jullian, A. Margain, L. F. Tz. Kwakman: Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis. Microelectronics Reliability 42(9-11): 1747-1752 (2002) |
| 1 | F. André | [1] |
| 2 | N. Bicaïs-Lépinay | [1] |
| 3 | S. Jullian | [1] |
| 4 | A. Margain | [1] |
| 5 | R. Pantel | [1] |