| |
| 2002 | ||
|---|---|---|
| 3 | EE | Jon Barth, John Richner: Correlation considerations: Real HBM to TLP and HBM testers. Microelectronics Reliability 42(6): 909-917 (2002) |
| 2 | EE | Leo G. Henry, Jon Barth, Hugh Hyatt, Tom Diep, Michael Stevens: Charged device model metrology: limitations and problems. Microelectronics Reliability 42(6): 919-927 (2002) |
| 2001 | ||
| 1 | EE | Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth: The importance of standardizing CDM ESD test head parameters to obtain data correlation. Microelectronics Reliability 41(11): 1789-1800 (2001) |
| 1 | Tom Diep | [1] [2] |
| 2 | Leo G. Henry | [1] [2] |
| 3 | Hugh Hyatt | [2] |
| 4 | Mark A. Kelly | [1] |
| 5 | John Richner | [3] |
| 6 | Michael Stevens | [2] |