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| 2002 | ||
|---|---|---|
| 1 | EE | Leo G. Henry, Jon Barth, Hugh Hyatt, Tom Diep, Michael Stevens: Charged device model metrology: limitations and problems. Microelectronics Reliability 42(6): 919-927 (2002) |
| 1 | Jon Barth | [1] |
| 2 | Tom Diep | [1] |
| 3 | Leo G. Henry | [1] |
| 4 | Michael Stevens | [1] |