Leo G. Henry

2002
2	EE	Leo G. Henry, Jon Barth, Hugh Hyatt, Tom Diep, Michael Stevens: Charged device model metrology: limitations and problems. Microelectronics Reliability 42(6): 919-927 (2002)
2001
1	EE	Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth: The importance of standardizing CDM ESD test head parameters to obtain data correlation. Microelectronics Reliability 41(11): 1789-1800 (2001)

Coauthor Index

1	Jon Barth	[1] [2]
2	Tom Diep	[1] [2]
3	Hugh Hyatt	[2]
4	Mark A. Kelly	[1]
5	Michael Stevens	[2]